Varian 87-146-811 Rev B 205 12.5-51Hz Probe Overview
The Varian 87-146-811 Rev B 205 12.5-51Hz Probe (model 949400) is a specialized measurement instrument designed for precision testing in semiconductor and PCB manufacturing applications. This revision B unit provides frequency coverage between 12.5 and 51 Hz, enabling engineers and technicians to perform reliable signal acquisition and analysis across critical frequency ranges.
Key Features
- Frequency range: 12.5–51 Hz
- Revision B design for proven reliability and performance
- Engineered for semiconductor and PCB testing applications
- Precision measurement capability for electronics manufacturing
- Model number 949400 for positive identification
Technical Specifications
Verify compatibility with your system integrator before ordering. The following information is based on available product identification:
- Manufacturer: Varian Associates
- Model Number: 87-146-811 Rev B 205
- Part Number: 949400
- Frequency Range: 12.5–51 Hz
- Product Type: Test and Measurement Probe
- Application Field: Semiconductor/PCB Manufacturing
- Condition: Used, fully functional
Typical Applications
The Varian 87-146-811 Rev B probe is suitable for:
- Semiconductor device characterization and testing
- PCB signal integrity measurements
- Low-frequency RF probe applications
- Manufacturing test and quality assurance
- Component validation and inspection
Compatibility & Replacements
Compatible With
Verify compatibility with your system integrator before ordering. This probe is designed for semiconductor and PCB testing environments using measurement equipment that supports 12.5–51 Hz frequency analysis.
Replaces / Drop-In Replacement For
No verified replacement information is available. Contact your system integrator or equipment manufacturer to confirm interchangeability with your existing probe or test system.
Works With
Compatible with semiconductor and PCB testing equipment requiring low-frequency precision probes. Verify compatibility with your system integrator before ordering.
